xTEST
- An Innovation Prober Solution
A smart adaptive controller to the prober, optimizing prober on the fly to achieve test time reduction and reduce site imbalance issue to achieve yield target
xReprobe
Provides auto calculated reprobing path, designed to:
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Minimize wafer test time
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Maximize recovery rate by using best yielding sites
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Clean result to see fab/device issue
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Improve OEE (Overall Equipment Efficiency)
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Improve cycle time
Patent: US-10753970, TW-I639846​
xCleaning
Provides proactive control in cleaning to:
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Maintain target yield
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Provide maximum throughput by only cleaning when needed
xSETUP
A prober setup tool to allow completion of the following setup requests automatically:
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Planarity check
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Contact OD optimization
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Correlation data verification
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Gauge R&R
xDATA
A real time data analysis tool to help identify production issues including:
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Setup stability
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Equipment OEE
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Material issue pre-alert
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It also supports real-time data streaming to any database upon request
