xTEST
- An Innovation Prober Solution

A smart adaptive controller to the prober, optimizing prober on the fly to achieve test time reduction and reduce site imbalance issue to achieve yield target

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xReprobe

Provides auto calculated reprobing path, designed to:

  • Minimize wafer test time

  • Maximize recovery rate by using best yielding sites

  • Clean result to see fab/device issue

  • Improve OEE (Overall Equipment Efficiency) 

  • Improve cycle time

Patent: US-10753970, TW-I639846​

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xCleaning

Provides proactive control in cleaning to:

  • Maintain target yield

  • Provide maximum throughput by only cleaning when needed

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xSETUP

A prober setup tool to allow completion of the following setup requests automatically:

  • Planarity check

  • Contact OD optimization

  • Correlation data verification

  • Gauge R&R

xDATA

A real time data analysis tool to help identify production issues including:

  • Setup stability

  • Equipment OEE

  • Material issue pre-alert

It also supports real-time data streaming to any database upon request

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